Nambari ya Bidhaa ya Mtengenezaji:
SN74LVTH18646APM
Product Overview
Mtengenezaji:
Texas Instruments
Nambari ya Kipande:
SN74LVTH18646APM-DG
Maelezo:
IC SCAN-TEST-DEV/XCVR 64-LQFP
Maelezo ya Kina:
ABT Scan Test Device With Transceivers and Registers IC 64-LQFP (10x10)
Hesabu:
305 Pcs Mpya Halisi Katika Hifadhi
1862955
Omba Nukuu
Kiasi
Kiasi cha chini 1
Kiasi cha chini 1
(*) ni lazima
Tutakurudishia jibu ndani ya masaa 24
Tutakurudishia jibu ndani ya masaa 24
TUMA
SN74LVTH18646APM Maalum ya Kiufundi
Kikundi
Ufunguo, Mifumo Maalum ya Mantiki
Mtengenezaji
Texas Instruments
Ufungashaji
Tray
Mfululizo
74LVTH
Hali ya Bidhaa
Active
Aina ya Mantiki
ABT Scan Test Device With Transceivers and Registers
Voltage ya Ugavi
2.7V ~ 3.6V
Idadi ya biti
18
Joto la Uendeshaji
-40°C ~ 85°C
Aina ya Kuweka
Surface Mount
Kifurushi / Kesi
64-LQFP
Kifurushi cha Kifaa cha Muuzaji
64-LQFP (10x10)
Nambari ya Bidhaa ya Msingi
74LVTH18646
Karatasi za Takwimu na Nyaraka
Karatasi za data
Taarifa za Ziada
Kifurushi cha Kawaida
160
Majina mengine
-296-8703-DG
-296-8703
-SN74LVTH18646APMG4
2156-SN74LVTH18646APM
296-8703-NDR
-SN74LVTH18646APM-NDR
296-8703
SN74LVTH18646APMG4
SN74LVTH18646APMG4-DG
TEXTISSN74LVTH18646APM
-296-8703-NDR
-SN74LVTH18646APMG4-NDR
Uainishaji wa Mazingira na Usafirishaji
Hali ya RoHS
ROHS3 Compliant
Kiwango cha Usikivu wa Moisture (MSL)
3 (168 Hours)
Hali ya REACH
REACH Unaffected
ECCN
EAR99
HTSUS
8542.39.0001
Digi Cheti
Bidhaa Zinazohusiana
SN74LVTH18646APMG4
IC SCAN-TEST-DEV/XCVR 64-LQFP
SN74TVC3010DBQR
IC PROG V CLAMP 24-QSOP
V62/04730-01XE
ENHANCED PRODUCT 3.3-V ABT SCAN